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Showing posts with label Chip. Show all posts
Showing posts with label Chip. Show all posts

Thursday, 13 June 2013

How 450mm wafers will change the semiconductor industry

The semiconductor industry's transition to making chips on 450-millimeter wafers is better described as a "transformation," Jonathan Davis of Semiconductor Equipment and Materials International writes. "The shift to 450mm will take a several years to manifest and numerous complexities are being skillfully managed by multiple organizations and consortia," he writes, adding, "However, once the changeover occurs, in hindsight, most in the industry will recognize that they participated in something transformational."

Even for the segments that continue manufacturing semiconductor devices on 300mm and 200mm silicon wafers, the industry will change dramatically with the introduction of 450mm wafer processing. The 450mm era will impact industry composition, supply chain dynamics, capital spending concentration, future R&D capabilities and many other facets of today’s semiconductor manufacturing industry — not the least of which are the fabs, wafers and tools with which chips are made.

The shift to 450mm will take a several years to manifest and numerous complexities are being skillfully managed by multiple organizations and consortia.   For those reasons, the evolutionary tone of “transition” seems appropriate. However, once the changeover occurs, in hindsight, most in the industry will recognize that they participated in something transformational.

No transformation occurs in isolation and other factors will contribute to the revolutionary qualities of 450mm.  Market factors, new facilities design, next generation processing technology, the changing dynamics of node development and new materials integration will simultaneously affect the industry landscape.

While reading about the implications of 450mm is valuable, I believe that there is much to learn by being a part of the discussion. How is this future transformation being envisioned and acted on today?  I hope that you will join us — at our “live” event, where you will have the opportunity to hear first-hand information… direct from well-informed experts in the industry.

Potential revisions in the 450mm wafer specification are under consideration.  At least two issues are currently being evaluated by the industry and both portend significant ramifications for wafer suppliers, equipment makers and those technologies that interface with the wafer.

First, the wafer orientation method may be revised to eliminate the orientation “notch” on the perimeter of the substrate. The notch was introduced in the 300mm transition as an alternative to the flat.  However, both equipment suppliers and IC makers, through a constructive and collaborative dialog, have concluded that eliminating the notch can potentially improve the die yield, tool performance and cost.

Secondly, reduction of the wafer edge exclusion area — that peripheral portion of the silicon on which no viable device structure occurs — also offers potential yield advantages.  The current 450mm wafer specification (SEMI E76-0710), originally published in 2010, calls for a 2mm edge exclusion zone.  IC makers believe that reduction of this area to a 1.5mm dimension offers the cost equivalence of a 1 percent yield increase.  Though a percent may sound trivial, it is represents substantial increased value over time.

Along with cost and efficiency improvements, IC makers and consortia driving the transition to 450mm manufacturing expect to achieve similar or better environmental performance. Larger footprints and resource demands from 450mm facilities in conjunction with mandates for environmentally aware operations are compelling fabs and suppliers to consider sustainability and systems integration at greater levels than ever before.

Experts in fab facilities, energy, water and equipment engineering will discuss the implications of 450mm to environment, health and safety during the SEMICON West 450mm Manufacturing EHS Forum on Wednesday, July 10.

Included in the presentations are perspectives from the Facility 450 Consortium (F450C) including Ovivo, Edwards and M+W Group.  A holistic Site Resource Model that provides semiconductor manufacturers visibility into effective reduction of total energy and water demands for individual systems, as well as for the entire facility will be reviewed by CH2M Hill. The model is an integrated analytical approach to assess and optimize a semiconductor facility’s thermal energy, electrical energy, and water demand, as well as the cost associated with these resources.

Sunday, 24 February 2013

6 Ways to Improve Chip Yield Even Before the Project Starts

13782587-bulb-on-computer-chip--technology-concept Early on in Chip projects, yield is not taken very seriously. The common thinking goes –  anyhow there isn’t much to do as this early point of time. However, there are actually several things you can do even before the Chip design starts, which will translate to clear savings.

1- Know your Yield

Yield has a great deal of impact only if production volume is high. If you plan to manufacture only a few tens of thousands of components, perhaps yield is not the most important topic in your project’s plan.

Yield can be roughly calculated or estimated before the project has even started. Yet, if you have calculate a yield target of 95% there is no reason to invest money and efforts to try improving the yield from (the calculated) 95% to 99% because that would not be possible.  Therefore, it is important that you have calculated your yield and set that as a goal.

2- Consider Foundry Applicability

Semiconductor foundries are not taking any yield losses. It is not the fab responsibility whether your yield is high or low because they sell wafers and not dies. Therefore you should select the foundry the suits best to your Chip domain.

If you chip requires small node geometries go to GLOBALFOUNDRIES, TSMC etc. If you chip needs excellent RF performance go to: IBM, TowerJazz etc. The foundry can help you calculating the wafer yield based on their own process technology. If you can provide them with die size, number of layers, process node and options, they should be able to provide you with a very accurate yield figures for your project.

3- Match Design Team Experience to Your Project

If you have decided to outsource the frond-end and physical design activities to an external vendor, the main yield-related risk here is experience. If the design team does not have the relevant experience that matches your chip project (for instance: RF, High Voltage) you are really wasting your time. Don’t hire analog designer without high voltage experience if you need to design a 120V chip.

4- Select Silicon Proven IPs

More and more companies are shopping for Semiconductor IPs to help reduce time to market and minimize engineering cost. There are many IP vendors with high quality products and some with lower quality. The keyword here is risk minimization. You really want to make sure the IP blocks you are about to purchase and integrate into your chip are bug free and have been silicon proven and qualified for your process. Ask for test results and references.

5- Follow Package Design Rules

For simple QFN packages there are no real concerns besides following the assembly house design rules. However complex packages can reduce yield dramatically. If your chip uses a package that consists of a multilayer substrate with high speed signals, this substrate should be considered as part of the silicon die. Improper routing of high speed signals, for example, will make the substrate performance very marginal and thus result in failures during final test.

6 – Say No to Tight Test Limits, Say Yes to Better Hardware

The only place to measure yield is at the testing phase. And this is done by the ATE.

Great ASIC engineers often try to over-engineer the chip design and as a by-product also tighten up the test result criteria. These limits will have direct impact on your profit. Every device that fails to meet limits during the screening process will be scraped. Therefore, don’t create the perfect test specification. Make one that meets your system requirements.

Loadboards, sockets and probecards have different quality levels and therefore different cost. But since these are the actual physical interface between your chip and the tester, you want to make sure they have the right quality and durably to allow solid connectivity to the tester during the test period. Otherwise, lower quality hardware will shave off your yield figures. Sockets for example, have limited number of insertions; you therefore should buy a socket that meets your chip production volume. Bottom-line — don’t compromise on the quality of the hardware interfacing your chip.

There is so much more to write on this topic, we promise to write more articles in the future. Stay tuned.

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